Design Automation and Test in Europe
March 25-29 2019
Florence, Italy

Seven pre-conference tutorials will be given on Monday, March 25th. They are all half-day tutorials running in parallel in the afternoon. Participants can attend any tutorial and may move between tutorials during the session. You will need to select one initial tutorial when registering for planning purposes.

Information about the tutorials (i.e. titles, organisers, speakers, and abstracts) can be found in this link:

https://www.date-conference.com/conference/monday-tutorials.

The following 2 tutorials are in the core of topics covered the IEEE Computer Society Test Technology Technical Council (TTTC) and they have earned official certification from TTTC through the Test Technology Educational Program (TTEP).

Tutorial M01: Applications of Machine Learning in Semiconductor Manufacturing and Test

Speakers: Haralampos-G. Stratigopoulos, Sorbonne Université, CNRS, LIP6, France
                 Yiorgos Makris, The University of Texas at Dallas, USA

Abstract: Throughout the lifetime of an integrated circuit, a wealth of data is collected for ensuring its robust and reliable operation. Ranging from design-time simulations to process characterization monitors, and from high-volume specification tests to diagnostic measurements on customer returns, the information inherent in this data is invaluable. Mining this information using machine learning methods has seen intense interest and numerous breakthroughs in recent years. This tutorial seeks to elucidate the utility of machine learning in semiconductor manufacturing and test. Relevant concepts from machine learning will be introduced, agglomerated with current practice, and showcased using industrial data. Recommendations for practitioners will also be given.

Tutorial M05: Safety and Security in Automotive 2.0 Era

Speakers: Prasanth Viswanathan Pillai, Texas Instruments, India
                 Srivaths Ravi, Texas Instruments, India

Abstract: The increasing semiconductor consumption has been spurred by a revolution witnessed in the automotive industry. The integration of electronics and networking into conventional automobile driven by infotainment and ADAS a few years back is accelerated by megatrends of EV/HEV, autonomous driving and shared mobility. These trends, termed sometimes as "Automotive 2.0", drive various requirements into the semiconductors being sourced. Of these, safety and security requirements are becoming paramount due to their impact and liability. This tutorial leverages the authors' experiences in driving safety and security as a part of semiconductor development cycles. By breaking down complex system requirements into foundational ones at semiconductor level, the tutorial is intended to provide an accessible treatment of the subject for any semiconductor developer.

Please register at https://www.date-conference.com/registration.

Monday Tutorials Chair

Marco Platzner, University of Paderborn, Germany
monday-tutorials@date-conference.com

DATE 2019 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).